X-ray characterization of just one atom: A pioneering accomplishment

Zaman, Shahid

2023-09-06

10.1016/j.matt.2023.07.028

MATTER   影响因子和分区

2590-2393

2590-2385

Synchrotron X-ray characterization is a common practice in material research to accurately identify the distinctive characteristics at ultrahigh resolution down to atomic level. In a recent issue of Nature, Saw Wai Hla et al. unveil the X-ray probing of a single atom, a groundbreaking discovery in material characterizations. This study utilized a specialized tip detector for X-ray signal detection generated from single iron and terbium atoms that confirms the atomically localized detection in the tunneling regime. While this is an incredible breakthrough for understanding the material properties at the single-atom level, it is still important to consider how it could be extended to other atoms and fields and how it may impact future research.

SCI

英语

第一 ; 通讯

Materials Science

Materials Science, Multidisciplinary

WOS:001138090100001

CELL PRESS

Web of Science

Southern Univ Sci & Technol, Dept Mech & Energy Engn, Key Lab Energy Convers & Storage Technol, Shenzhen 518055, Peoples R China

Zaman, Shahid. X-ray characterization of just one atom: A pioneering accomplishment[J]. MATTER,2023,6(9).

Zaman, Shahid.(2023).X-ray characterization of just one atom: A pioneering accomplishment.MATTER,6(9).

Zaman, Shahid."X-ray characterization of just one atom: A pioneering accomplishment".MATTER 6.9(2023).