中文版 | English
题名

Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials

作者
通讯作者Wang, Lin; Chen, Xiaolong
发表日期
2022-07-09
DOI
发表期刊
EISSN
2041-1723
卷号13期号:1
摘要
["Van der Waals materials exhibit unique thermomechanical properties, but interlayer deformations are usually challenging to measure. Here, the authors exploit the strain-dependent optical properties of monolayer WSe2 to quantitatively probe the interlayer shear thermal deformations and interlayer coupling in phosphorene and hexagonal boron nitride.","Atomically-thin van der Waals layered materials, with both high in-plane stiffness and bending flexibility, offer a unique platform for thermomechanical engineering. However, the lack of effective characterization techniques hinders the development of this research topic. Here, we develop a direct experimental method and effective theoretical model to study the mechanical, thermal, and interlayer properties of van der Waals materials. This is accomplished by using a carefully designed WSe2-based heterostructure, where monolayer WSe2 serves as an in-situ strain meter. Combining experimental results and theoretical modelling, we are able to resolve the shear deformation and interlayer shear thermal deformation of each individual layer quantitatively in van der Waals materials. Our approach also provides important interlayer coupling information as well as key thermal parameters. The model can be applied to van der Waals materials with different layer numbers and various boundary conditions for both thermally-induced and mechanically-induced deformations."]
相关链接[来源记录]
收录类别
语种
英语
重要成果
NI期刊 ; NI论文
学校署名
第一 ; 通讯
资助项目
open research fund of Songshan Lake Materials Laboratory[2021SLABFN02] ; National Natural Science Foundation of China["61904077","92064010","61801210","91833302"] ; National Key R&D Program of China[2020YFA0308900] ; Jiangsu Province[XYDXX-021]
WOS研究方向
Science & Technology - Other Topics
WOS类目
Multidisciplinary Sciences
WOS记录号
WOS:000822541400005
出版者
Scopus记录号
2-s2.0-85133726334
来源库
Web of Science
引用统计
被引频次[WOS]:5
成果类型期刊论文
条目标识符//www.snoollab.com/handle/2SGJ60CL/355845
专题工学院_电子与电气工程系
作者单位
1.Southern Univ Sci & Technol, Dept Elect & Elect Engn, 1088 Xueyuan Ave, Shenzhen 518055, Peoples R China
2.Nanjing Tech Univ Nanjing Tech, Key Lab Flexible Elect KLOFE, 30 South Puzhu Rd, Nanjing 211816, Peoples R China
3.Nanjing Tech Univ Nanjing Tech, Inst Adv Mat IAM, 30 South Puzhu Rd, Nanjing 211816, Peoples R China
第一作者单位电子与电气工程系
通讯作者单位电子与电气工程系
第一作者的第一单位电子与电气工程系
推荐引用方式
GB/T 7714
Zhang, Le,Wang, Han,Zong, Xinrong,et al. Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials[J]. NATURE COMMUNICATIONS,2022,13(1).
APA
Zhang, Le.,Wang, Han.,Zong, Xinrong.,Zhou, Yongheng.,Wang, Taihong.,...&Chen, Xiaolong.(2022).Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials.NATURE COMMUNICATIONS,13(1).
MLA
Zhang, Le,et al."Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials".NATURE COMMUNICATIONS 13.1(2022).
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